Sick Contrast Sensors 13 mm, IO-Link, PNP, 100 mA, 10 → 30 V dc, IP67

TwinEye-Technology for increased depth of field and sensing distance tolerance
50 kHz switching frequency and 5 μs jitter
Large dynamic range means reliable detection of contrasts on glossy materials
7-segment display
Color mode
Assembly feedback
IO-Link and automation functions
Flexible sensor setting thanks to various sensor parameters

1:1 replacement for existing KT series - assembly compatibility
TwinEye-Technology for better performance on glossy or jittering materials - less machine downtime and more process stability
Multi-functional sensor adjustment for individual sensor adjustment
Excellent contrast resolution and a large dynamic range for good performance on complex materials
High flexibility thanks to a range of teach-in processes
Integrated color mode - stable detection even with complex color differences
Job storage in sensor - flexible process design and format change
Diagnostics and visualization as well as easy format change via IO-Link

Outstanding performance for a variety of applications, even with difficult framework conditions: The new KTX Prime with familiar hole pattern, high-precision RGB LED and VISTAL® housing impresses with TwinEye-Technology, color mode, high switching frequency, excellent gray line resolution, 7-segment display and IO-Link. The response time of 10 μs and a jitter of 5 μs ensure accurate detection of contrast differences, even at high machine speeds. Thanks to various teach-in processes, integrated color mode and variable sensor adjustment, commissioning is more flexible and the processes more stable. The KTX Prime provides additional diagnosis and analysis data via IO-Link. The new KTX Prime - it can easily do more.

Applications in which contrast is a distinguishing feature
Print mark detection for controlling the cutting process
Print control in the printing industry
Positioning tubes
Label alignment on bottles
Precise detection of print marks
Contrast mark detection
Detecting print marks
Monitoring of wafers
Roll end monitoring
Color control in yarn or line production